17 results
Electron Microscopy and Raman Characterization of Multi-Walled Carbon Nanotubes Grown by Chemical Vapor Deposition
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 304-305
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- August 2008
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Ni-Cu-Zn Ferrite Prepared by Aloe Vera Plant Extract or Egg White
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 326-327
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- August 2008
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Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1130-1131
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- August 2008
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Remote Microscopy for Education and Outreach
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 874-875
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- August 2008
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Growth and Characterization of Crystalline Tin Oxide Nanostructures
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 682-683
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- August 2007
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Effect of RF-PECVD Synthesis Conditions on the Carbon Nanotube Growth
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 662-663
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- August 2006
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Review: Detection and Identification of Unknown Substances
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 344-345
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- August 2006
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Flattening of the Si-SiO2 Interface in Ultra-Thin SIMOX Structures
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1794-1795
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- August 2005
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Effect Of Capping Layer During Annealing of Low-Dose Lowenergy Simox Materials
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 1090-1091
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- August 2000
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Control of Si-Island Free Ultra-Thin Simox Structures by Implant Energy and Oxygen Dose
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 746-747
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- August 1999
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Effects of Protective Capping on Ultra-Thin SIMOX Structures
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 744-745
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- August 1999
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Magnetization of carbon-coated ferromagnetic nanoclusters determined by electron holography
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- Journal of Materials Research / Volume 14 / Issue 7 / July 1999
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- 31 January 2011, pp. 2861-2870
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- July 1999
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TEM Analysis of Defects in Simox Silicon-On-Insulator Material
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 473-474
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- August 1997
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Computer Network Laboratory for Microscopy Education at the Materials Science and Engineering Department, The University of Arizona
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- Microscopy Today / Volume 3 / Issue 1 / February 1995
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- 14 March 2018, pp. 14-15
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- February 1995
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Control of Silicon Nanocrystallite Luminescence Behavior Through Surface Treatments
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- MRS Online Proceedings Library Archive / Volume 405 / 1995
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- 15 February 2011, 277
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- 1995
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Oxygen Bubble Formation and Transformation During High-Dose Oxygen Implantation and Annealing of Silicon
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- MRS Online Proceedings Library Archive / Volume 201 / 1990
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- 26 February 2011, 229
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- 1990
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Analysis for the Characterization of Oxygen Implanted Silicon (SIMOX) by Spectroscopic Ellipsometry†
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- MRS Online Proceedings Library Archive / Volume 209 / 1990
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- 26 February 2011, 493
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- 1990
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